NIST工業(yè)性能測試用標準品1
NIST工業(yè)性能測試用標準品1
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產(chǎn)品信息:
貨號 | 英文名 | 中文名 | 包裝 |
NIST-148 | Nicotinic Acid | * | 2 g |
NIST-1082 | Cigarette Ignition Strength Standard | 香煙點火強度標準 | 1 carton (200 cigarettes) |
NIST-1196 | Standard Cigarette for Ignition Resistance Testing | 香煙標準抗引燃性測試 | 2 cartons(400 cigarettes) |
NIST-2151 | Nicotinic Acid (Combustion Calorimetric Standard) | * | 25 g |
NIST-1202 | Fabric Smoldering Ignition Testing Materials | 織物材料陰燃點火測試 | 1 box |
NIST-1453 | Thermal Conductivity - Expanded Polystyrene Board | 熱導率——發(fā)泡聚苯乙烯板 | each |
NIST-1459 | Thermal Resistance - Fumed Silica Board | 熱阻,氣相法白炭黑 | each |
NIST-1514 | Thermal Analysis Purity Set (DSC) | 熱分析純度集(DSC) | set (4) |
NIST-1990 | Lattice Parameter/Single, Crystal (Ruby Spheres) | 晶格參數(shù) | 3 spheres |
NIST-2538 | Polarization-Mode Dispersion (Non-Mode-Coupled) | 極化模式分散 | each |
NIST-2541 | Silicon Resistivity | 硅電阻率 | each |
NIST-2543 | Silicon Resistivity | 硅電阻率 | each |
NIST-2556 | Recycled Pellet (Autocatalyst) | 再生顆粒 | 70 g |
NIST-2557 | Recycled Monolith (Autocatalyst) | 再生整體式 | 70 g |
NIST-1984 | Thermal Spray Powder - Particle Size Distribution Tungsten Carbide/Cobalt (Acicular) | 熱噴涂粉末粒度分布,碳化鎢/鈷(針狀) | 14 g |
NIST-1985 | Thermal Spray Powder - Particle Size Distribution Tungsten Carbide/Cobalt (Spheroidal) | 熱噴涂粉末粒度分布,碳化鎢/鈷(球狀) | 14 g |
NIST-1358b | Coating Thickness Standard, (Nonmagnetic Coating on Steel) | 涂層厚度標準 | set (5) |
NIST-1359b | Coating Thickness Standard (Nonmagnetic Coating on Steel) | 涂層厚度標準 | set (5) |
NIST-1361b | Coating Thickness Standard (Nonmagnetic Coating on Steel | 涂層厚度標準 | set (5) |
NIST-1362b | Coating Thickness Standard (Nonmagnetic Coating on Steel | 涂層厚度標準 | set (5) |
NIST-1363b | Coating Thickness Standard (Nonmagnetic Coating on Steel) | 涂層厚度標準 | set (5) |
NIST-1364b | Coating Thickness Standard (Nonmagnetic Coating on Steel | 涂層厚度標準 | set (5) |
NIST-2579a | Lead Paint Films for Portable XRF Analyzers | 含鉛油漆電影便攜式光譜儀分析程序 | set (6) |
NIST-1921b | IR Transmission Wavelength (Polystyrene Film) | 紅外傳輸波長 | 1 card |
NIST-2035a | Ultraviolet-Visible-Near-Infrared Wavelength/Wavenumber Transmission Standard | Ultraviolet-Visible-Near-Infrared Wavelength/Wavenumber Transmission Standard | each |
NIST-2036 | Near-IR Wavelength/Wavenumber Reflection | 紅外線波長 | each |
NIST-2260a | Aromatic Hydrocarbon in Toluene | 波長校準標準 | 5 x 1.2 mL |
NIST-2514 | Wavelength Calibration Reference for 1560 nm to 1595 nm (Carbon Monoxide C-12/O-16) | 波長校準標準 | each |
NIST-2515 | Wavelength Calibration Reference for 1595 nm to 1630 nm (Carbon Monoxide C-13/O-16) | 波長校準標準 | each |
NIST-2517a | High Resolution Wavelength Calibration Reference for 1510–1540 nm Acetylene 12C2H2 | 高分辨率波長校準 | each |
NIST-2518 | Polarization Mode Dispersion | 波長校準標準 | each |
NIST-2519a | High Resolution Wavelength Calibration Reference for 1530-1565 nm Hydrogen Cyanide | 高分辨率波長校準 | each |
NIST-8130 | Coplanar Waveguide Calibration Set | 共面波導校準 | each |
NIST-624 | Lead-Silica, for dc resistivity | 鉛硅直流電阻率 | 200 g |
NIST-17f | Sucrose Optical Rotation | 蔗糖旋光度 | 60 g |
NIST-39j | Benzoic Acid (Calorimetric Standard) | 苯甲酸(量熱標準) | 30 g |
NIST-45d | Cu Freezing Point | 銅凝固點 | 450 g |
NIST-49e | Lead Freezing Point | 鉛凝固點 | 600 g |
NIST-84l | Potassium Hydrogen Phthalate | 苯二甲酸氫鉀 | 60 g |
NIST-185i | Potassium Hydrogen Phthalate, pH Standard | 鄰苯二甲酸氫鉀,pH標準 | 60 G |
NIST-186g | pH Standards, (set of 186-I-g + 186-II-g) | pH標準 | set |
NIST-188 | Potassium Hydrogen Tartrate, pH | 酒石酸氫鉀,pH | 60 g |
NIST-189c | Potassium Tetroxalate Dihydrate pH Standard | 四草酸鉀 | 65 g |
NIST-191d | pH Standards, (set of 191d-I + 191d-II) | pH標準 | 1 bottle x25g;1bottlex30g |
NIST-640d | Silicon Powder Line Positio, n&nb, sp;+, Line Shape Std for Powder Dif | 硅粉線位置+線形狀Std粉 | 7.5 g |
NIST-660b | Line Position and Line Shape, Std for Powder Diffraction | 線位置和形狀、粉末衍射 | 6 g |
NIST-720 | Sapphire Heat Capacity | 藍寶石熱容量 | 15 g |
NIST-723e | Tris Acidimetric | 酸量滴定 | 50 g |
NIST-738 | Stainless Steel - Thermal Expansion | 不銹鋼-熱膨脹 | 51 x 6.4 mm |
NIST-740a | Zinc (Freezing Point) | 鋅凝固點 | 200 g |
NIST-741a | Tin (Freezing Point) | 錫凝固點 | 200 g |
NIST-742 | Alumina (Reference Point) | 氧化鋁參考點 | 10 g |
NIST-774 | Lead-Silica (Dielectric Constant) | 鉛-二氧化硅(介電常數(shù)) | block |
NIST-781d2 | Molybdenum (Heat Capacity) | 鉬(熱性能) | 10 cm |
NIST-869b | Column Selectivity Test Mixture for Liquid Chromatography | 柱性能測試混合物液相色譜 | 5 x 1.1 mL |
NIST-870 | Column Performance Test Mixture of Liquid Chromatography | 柱性能測試混合物液相色譜 | 5 x 1.1 mL |
NIST-935a | Potassium Dichromate, UV Absorbance Standard | 重鉻酸鉀 | 15 g |
NIST-1003c | Glass Beads - Particle Size Distribution | 玻璃珠,粒度分布 | 28 g |
NIST-1655 | Potassium Chloride, KCl (cr) for Solution Calorimetry | 氯化鉀,氯化鉀量熱法(cr)溶液 | 30 g |
NIST-1745 | Indium (Freezing Point) | 銦凝固點 | 200 g |
NIST-1746 | Silver (Freezing Point) | 銀凝固點 | 300 g |
NIST-1747 | Tin Freezing Point Cell | 錫凝固點 | each |
NIST-1748 | Zinc Freezing Point Cell | 鋅凝固點 | each |
NIST-1749 | Gold vs. Platinum Thermocouple Thermometer | 金和鉑熱電偶溫度計 | each |
NIST-1750 | Standard Platinum Resistance Thermometer | 標準鉑電阻溫度計 | each |
NIST-1751 | Gallium Melting-Point | 鎵熔點 | 200 g |
NIST-1893 | Copper Microhardness Test Block (Knoop) | 銅努氏顯微硬度測試 | each |
NIST-1894a | Vickers Microhardness of Copper | 顯微硬度維氏 | each |
NIST-1895 | Nickel Microhardness Test Block (Knoop) | 銅努氏顯微硬度測試 | each |
NIST-1896b | Vickers Microhardness of Nickel | 顯微硬度維氏 | each |
NIST-1900 | Specific Surface Area Standard | 比表面積 | 4 g |
NIST-1905 | Nickel Microhardness Test Block (Knoop) | 鎳努氏顯微硬度測試 | each |
NIST-1906 | Nickel Microhardness Test Block (Knoop) | 鎳努氏顯微硬度測試 | each |
NIST-1907 | Nickel Microhardness Test Block (Knoop) | 鎳努氏顯微硬度測試 | each |
NIST-1908 | Vickers Microhardness of Nickel | 鎳維氏顯微硬度 | each |
NIST-1909 | Vickers Microhardness of Nickel | 鎳維氏顯微硬度 | each |
NIST-1917 | Mercury Porosimetry Standard | 壓汞儀法標準氧化鋁球 | 10 g |
NIST-1918 | Mercury Porosimeter Intrusion Standard | 壓汞儀法標準擠壓 | 12 g |
NIST-1968 | Gallium Melting Point | 鎵熔點 | each |
NIST-1969 | Rubidium Triple Point | 銣三相點 | each |
NIST-1970 | Succinonitrile Triple Point | 丁二三相點 | each |
NIST-1971 | Indium Freezing-Point | 銦凝固點 | each |
NIST-1972 | 1,3-Dioxolan-2-one Triple Point | 1、3-二氧戊環(huán)-2-one三相點 | 60 g |
NIST-1978 | Zirconium Oxide (Particle Size) | 氧化鋯(粒徑) | 5 g |
NIST-1982 | Zirconia Thermal Spray Powder | 氧化鋯熱噴霧粉末 | 10 g |
NIST-2073a | Sinusoidal Roughness | 正弦粗糙度 | each |
NIST-2074 | Sinusoidal Roughness | 正弦粗糙度 | each |
NIST-2075 | Sinusoidal Roughness | 正弦粗糙度 | each |
NIST-2093 | Low Energy Charpy V-Notch Impact Specimen (Self- Verification) | 低能量夏比v形缺口影響標本(自我驗證) | 5 bars |
NIST-2096 | High-Energy Charpy V-Notch Impact Specimen (NIST-Verification) | 高能夏比v形缺口影響標本 | set |
NIST-2097 | High Energy Charpy V Notch Impact Specimen (Self-Verification) | 高能夏比V型缺口影響標本(自我確證) | 5 bars |
NIST-2100 | Fracture Toughness of Ceramic | 陶瓷斷裂韌性 | 5 bars |
NIST-2112 | Dynamic Impact Force Verific Specimens (Nominal 24kN) | 動態(tài)沖擊力Verific標本 | set of four |
NIST-2113 | Dynamic Impact Force Verific, Specimens (Nominal 33kN) | 動態(tài)沖擊力Verific標本 | set of four |
NIST-2115 | Low Energy Izod Impact Specimen (NIST-Verification) | 低能量懸臂梁 | set |
NIST-2133 | Phosphorus Implant in Si Depth Profile | 磷在Si植入深度剖面 | each |
NIST-2134 | Arsenic in Silicon | 砷植 | each |
NIST-2135c | Ni-Cr Thin Film Depth Profile | Ni-Cr Thin Film Depth Profile | each |
NIST-2137 | B Implant in Si Depth Profile | B在Si植入深度剖面 | each |
NIST-2206 | Controlled Pore Glass - BET Specific Surface Area (300nm) | 控制孔玻璃——選擇比表面積(300nm) | 5 g |
NIST-2207 | Controlled Pore Glass - BET Specific Surface Area (18nm) | 控制孔玻璃——選擇比表面積(18m) | 5 g |
NIST-2214 | Isooctane Liquid Density | 異辛烷液體密度 | 4x5 mL |
NIST-2225 | Mercury (Differential Scanning Calorimeters) | 汞(鑒別掃描熱量計) | 2.5 g |
NIST-2232 | Indium DSC Calibration Standard - Temperature and Enthalpy of Fusion | 銦DSC校準標準——溫度和熔化焓 | 1 g |
NIST-2234 | Gallium for Thermal Analysis | 鎵用于熱分析 | approximay 2 g |
NIST-2235, | Bismuth for Thermal Analysis | 鉍用于熱分析 | 1.5 g |
NIST-2490 | Non-Newtonian Polymer Solution for Rheological Measurements | 聚合物流變法學 | 100 mL |
NIST-2669 | Arsenic Species in Frozen Human Urine | 冰凍中的砷形態(tài) | Set (10) (5 each conc.) |
NIST-2798a | Vickers Microhardness of Nickel | 顯微硬度 | each |
NIST-2810 | Rockwell C Hardness, Low Range | 羅氏硬度 | each |
NIST-2811 | Rockwell C Hardness, Mid Range | 羅氏硬度 | each |
NIST-2812 | Rockwell C Hardness, High Range | 羅氏硬度 | each |
NIST-2816 | Rockwell Hardness 15N Scale Low Range (Nominal 72 HR 15N) | 羅氏硬度 | 1 block |
NIST-2817 | Rockwell Hardness 15N Scale Mid Range (Nominal 83 HR 15N) | 羅氏硬度 | 1 block |
NIST-2818 | Rockwell Hardness 15N Scale,High Range (Nominal 91 HR 15N) | 羅氏硬度 | 1 block |
NIST-2819 | Rockwell Hardness 30N Scale Low Range (Nominal 45 HR30N) | 羅氏硬度 | 1 block |
NIST-2820 | Rockwell Hardness 30N Scale Mid Range (Nominal 64 HR30N) | 羅氏硬度 | 1 block |
NIST-2821 | Rockwell Hardness 30N Scale High Range (Nominal 79 HR30N) | 羅氏硬度 | 1 block |
NIST-2828 | Knoop Microhardness of Steel | 鋼微硬度普 | 1 block |
NIST-2829 | Vickers Microhardness of Steel | 維氏顯微硬度鋼 | 1 block |
NIST-2830 | Microhardness, Ceramic-Knoop | 顯微硬度陶瓷努氏, | each |
NIST-2831 | Vickers Hardness, Ceramics and Hardmetals | 維氏硬度 | each |
NIST-2841 | Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers | 外延層 | disk |
NIST-2842 | Semiconductor Thin Film: AlxGa1-xAs Epitaxial Layers | 外延層 | disk |
NIST-2881 | Polystyrene Absolute Molecular Mass Distribution Standard | 純粹聚苯乙烯分子量分布標準 | 0.3 g |
NIST-3451 | Low Temperature Seebeck Coefficient Standard | 低溫賽貝克標準 | bar |
NIST-5000 | Overlay Wafer Standard | 覆蓋晶圓標準 | each |
NIST-5001 | Two-Dimensional Grid Photomask, Std | 二維網(wǎng)格光罩標準 | each |
NIST-8091 | Scanning Electron Microscope Sharpness Standard | 掃描電子顯微鏡銳度標準 | each |
NIST-8096 | CMOS MEMS 5 in 1 Test Chip | CMOS MEMS 5 1測試芯片 | 1 computer chip |
NIST-8097 | MEMS 5 in 1 Test Chip | MEMS 5 1測試芯片 | 1 computer chip |
NIST-8441a | Wheat Hardness | 小麥硬度 | set (50) |
NIST-8445 | Spray-Dried Whole Egg for Allergen Detection | 全蛋粉噴霧 | 5 g |
NIST-8480 | Secondary Ferrite Number Standard - Low Range | 二次鐵素體數(shù)標準 | 10x12x20 |
NIST-8481 | Secondary Ferrite Number Standard - High Range | 二次鐵素體數(shù)標準 | set (8) |
NIST-8786 | Filter Blank for RM 8785 | 濾光片空白RM 8785 | filter |
NIST-8820 | Scanning Electron Microscope Scale Calibration Artifact | 人工尺度電子掃描電子顯微鏡 | 1 chip |
NIST-8988 | Titanium Dioxide Powder - Particle Size Distribution | 鈦-粒度分布 | 6 g |
NIST-1543 | GC/MS System Performance | GC/MS 系統(tǒng)性能 | 4 x 1 mL |
NIST-1976b | Instrument Response Std for, X-Ray Powder Diffraction | 儀器回應,x 射線粉末衍射 | 1 disc |
NIST-2000 | Calibration Standard for High-Resolution X-Ray Diffraction | 高分辨率x射線衍射校準標準 | 1 block |
NIST-2012 | Calibration Standard for High Resolution X Ray Diffraction | 高分辨率x射線衍射校準標準 | wafer |
NIST-2087 | Dimensional Standard for Medical Computed Tomography | 尺寸標準醫(yī)學計算機斷層掃描 | each |
NIST-2088 | Density Standard for Medical Computed Tomography | 醫(yī)學ct密度標準 | five foam blocks |
NIST-2241 | Relative Intensity Correction Standard for Raman Spectroscopy: 785 nm Excitation | 熒光光譜相對強度修正標準 | each |
NIST-2242 | Relative Intensity Correction Standard for Raman Spectroscopy: 532 nm Excitation | 相對強度校正標準拉曼光譜:532nm激發(fā) | each |
NIST-2244 | Relative Intensity Correction Standard for Raman Spectroscopy: 1064 nm Excitation | 熒光光譜相對強度修正標準 | each |
NIST-2245 | Relative Intensity Correction Standard for Raman Spectroscopy: 633 nm Excitation | 熒光光譜相對強度修正標準 | each |
NIST-2246 | Relative Intensity Correction Standard for Raman Spectroscopy: 830 nm Excitation | 相對強度校正標準拉曼光譜:830nm激發(fā) | each |
NIST-2940 | Relative Intensity Correction Standard for Fluorescence Spectroscopy: Orange Emission 412 nm | 熒光光譜相對強度修正標準 | each(12.5 x 12.5 x 45)mm |
NIST-2941 | Relative Intensity Correction Standard for Fluorescence Spectroscopy: Green Emission 427 nm | 熒光光譜相對強度修正標準 | each(12.5 x 12.5 x 45)mm |
, NIST-2942 | Relative Intensity Correction Standard for Fluorescence Spectroscopy: Ultraviolet Emission 310.0 nm | 熒光光譜相對強度修正標準 | each(12.5 x 12.5 x 45)mm |
NIST-2943 | Relative Intensity Correction Standard for Fluorescence Spectroscopy: Blue Emission | 熒光光譜相對強度修正標準 | each(12.5 x 12.5 x 45)mm |
NIST-2944 | Relative Intensity Correction Standard for Fluorescence Spectroscopy: Red Emission | 熒光光譜相對強度修正標準 | 510.0 nm |
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