Feritscope® FMP30C
在奧氏體和雙相鋼中，鐵素體含量在0.1?110 FN或0.1?80％Fe范圍內(nèi)的非破壞性測(cè)量
用戶友好的儀器操作
用戶友好的數(shù)據(jù)中心軟件
大顯示屏，豐富的240 x 160像素的對(duì)比度
USB端口用于數(shù)據(jù)傳輸?shù)絇C或打印機(jī)
機(jī)械滑塊可覆蓋測(cè)量操作不需要的鍵
準(zhǔn)備好在上電后進(jìn)行測(cè)量
Feritscope® FMP30C
在奧氏體和雙相鋼中，鐵素體含量在0.1?110 FN或0.1?80％Fe范圍內(nèi)的非破壞性測(cè)量
用戶友好的儀器操作
用戶友好的數(shù)據(jù)中心軟件
大顯示屏，豐富的240 x 160像素的對(duì)比度
USB端口用于數(shù)據(jù)傳輸?shù)絇C或打印機(jī)
機(jī)械滑塊可覆蓋測(cè)量操作不需要的鍵
準(zhǔn)備好在上電后進(jìn)行測(cè)量
通過儀器按鈕或PC通過外部觸發(fā)進(jìn)行探頭放置時(shí)自動(dòng)進(jìn)行測(cè)量
自動(dòng)探頭識(shí)別
測(cè)量采集的聲音信號(hào)
對(duì)于0.1至約90 FN的整個(gè)實(shí)際相關(guān)測(cè)量范圍，只需要進(jìn)行一次校準(zhǔn)。測(cè)量
精度符合ANSI / AWS Ad.2M / Ad。，2：1997標(biāo)準(zhǔn)
校準(zhǔn)標(biāo)準(zhǔn)可追溯到TWI二級(jí)標(biāo)準(zhǔn)或客戶特定標(biāo)準(zhǔn)
可調(diào)節(jié)儀器關(guān)閉或連續(xù)操作
可鎖定鍵盤/限制操作模式
顯示各種狀態(tài)（例如，當(dāng)電池電壓下降時(shí)的警告信息）
各種語言設(shè)置
測(cè)量單位可在WRC-FN和％Fe之間選擇
多達(dá)100個(gè)測(cè)量應(yīng)用程序特定校準(zhǔn)的應(yīng)用程序
將讀數(shù)分配到4,000個(gè)塊的能力
塊的日期和時(shí)間戳
圖形測(cè)量顯示為具有高斯圖的直方圖
輸入過程容限限制的能力和相關(guān)過程能力指數(shù)Cp和Cpk的計(jì)算
超過公差限制時(shí)的聲光警告
自由運(yùn)行顯示，附加顯示讀數(shù)作為容差極限之間的模擬量
用于連接的多點(diǎn)測(cè)量的矩陣測(cè)量，例如在預(yù)定義的表面陣列中
平均測(cè)量數(shù)據(jù)的能力：僅存儲(chǔ)幾個(gè)讀數(shù)的平均值
可通過面積測(cè)量進(jìn)行測(cè)量采集。只有直到探頭剝離才能讀取單個(gè)讀數(shù)并進(jìn)行平均
能夠用放置在樣品上的探頭連續(xù)測(cè)量
異常的拒絕自動(dòng)消除錯(cuò)誤的測(cè)量
通過覆蓋覆蓋錯(cuò)誤的已存儲(chǔ)的讀數(shù)
應(yīng)用鏈接：應(yīng)用程序的通用標(biāo)準(zhǔn)化/校準(zhǔn)能力
電池和線路電源操作（AC適配器可選附件）
內(nèi)存多達(dá)20,000張讀數(shù)
顯示統(tǒng)計(jì)公共特征值，如平均值，標(biāo)準(zhǔn)偏差，zui小值，zui大值，塊中的范圍和zui終結(jié)果。特征方差分析值的輸出
Feritscope® FMP30C
- Non-destructive measurement of the ferrite content in a range of 0.1 to 110 FN or 0.1 to 80% Fe in austenitic and duplex steel
- User-friendly instrument operation
- User-friendly Data Center Software
- Large display, rich in contrast with 240 x 160 pixels
- USB port for data transfer to PC or printer
- Mechanical sliders to cover keys not required for the measurement operation
- Ready to make measurements right after power-up
- Measurement automatic upon probe placement through external trigger via instrument button or PC
- Automatic probe recognition
- Audible signal of measurement acquisition
- Only one calibration required for the entire practically relevant measurement range from 0.1 to about 90 FN. Measurement
accuracy according to ANSI/AWS Ad.2M/Ad.,2:1997 standard - Calibration with standards traceable to TWI secondary standards or with customer-specific standards
- Adjustable instrument switch-off or continuous operation
- Lockable keyboard/restricted operating mode
- Various status displays (e.g., warning message when battery voltage drops)
- Various language settings
- Measurement units selectable between WRC-FN and %Fe
- Up to 100 applications for measuring application specific calibrations
- Capability of allocating readings into up to 4,000 blocks
| - Date and time stamp for blocks
- Graphical measurement display as a histogram with a Gaussian plot
- Capability of entering process tolerance limits and computation of the associated process capability indices Cp and Cpk
- Audible and visual warning when tolerance limits are exceeded
- Free-running display with additional presentation of the reading as an analog bar between the tolerance limits
- Matrix measuring made for connected multi-point measurements, e.g., in a pre-defined surface array
- Capability of averaging measurement data: Only the mean value of several readings will be stored
- Measurement acquisition through area measurement possible. Only single readings until probe lift-off are captured and averaged
- Capability to measure continuously with the probe placed on the specimen
- Outlier rejection for the automatic elimination of erroneous measurements
- Overwriting of erroneous and already stored readings through overwriting
- Application linking made: Ability for common normalization/calibration of applications
- Battery and line power operation (AC adapter optional accessory)
- Memory for up to 20,000 readings
- Display of statistical common characteristic values such as mean value, standard deviation, min, max, range in the block and final results. Output of characteristic variance-analytical values
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