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產(chǎn)品簡(jiǎn)介

產(chǎn)品簡(jiǎn)介:SimuLase™是款半導(dǎo)體模擬軟件,用戶通過它可以充分利用的半導(dǎo)體模型。通過軟件的全微觀多體模型,可用來精確驗(yàn)證/預(yù)測(cè)某些結(jié)構(gòu)參數(shù)的關(guān)鍵光電特性,如增益/吸收,折射率,自發(fā)輻射(光致發(fā)光)或由輻射和俄歇損耗造成的載流子損耗等,從而節(jié)省時(shí)間和昂貴的實(shí)驗(yàn)研究成本。

詳情介紹

    SimuLase(TM)半導(dǎo)體建模軟件:

    SimuLase™ is the first software tool that allows a broad audience to take full advantage of the latest in semiconductor modelling. It's underlying fully microscopic many-body models allow to determine/predict the essential electro-optical properties like gain/absorption, refractive indicies, spontaneous emission (photo luminescence) or carrier losses due to radiative and Auger losses, with unprecedented accuracy while removing fit-parameters that used to require time and cost-intensive experimental investigation.

    SimuLase™是款半導(dǎo)體模擬軟件,用戶通過它可以充分利用的半導(dǎo)體模型。通過軟件的全微觀多體模型,可用來精確驗(yàn)證/預(yù)測(cè)某些結(jié)構(gòu)參數(shù)的關(guān)鍵光電特性,如增益/吸收,折射率,自發(fā)輻射(光致發(fā)光)或由輻射和俄歇損耗造成的載流子損耗等,從而節(jié)省時(shí)間和昂貴的實(shí)驗(yàn)研究成本。

    Tools based on the microscopically calculated properties also allow to calculate macroscopic properties like transverse and longitudinal optical modes, reflectivity and transmission spectra, surface-PL spectra that take into account cavity effects that modify the pure material PL, threshold currents or operating characteristics for V(E)CSEL structures. SimuLase also allows for easy comparisons between experimental and theoretical results. The ground breaking quality of the underlying mircoscopic many-body models has been demonstrated in dozens of articles in peer-reviewed journals (see our publications section).

    用于微觀特性計(jì)算的工具也可以計(jì)算V(E)CSEL結(jié)構(gòu)的一些宏觀特性,例如橫模和縱模模式,反射和透射光譜,考慮空腔效應(yīng)的表面-PL光譜,閾值電流或工作特性等。通過Simulase模擬可以將實(shí)驗(yàn)結(jié)果與理論值進(jìn)行對(duì)比。利用微觀多體模型開展的創(chuàng)新研究已在很多論文中得到證明。(詳見后續(xù)的論文摘錄)。

    You can download a real-life deion of how SimuLase can be used to design, analyze and optimize e.g. edge-emitting devices and VECSELS here.

    SimuLase也提供了有關(guān)設(shè)計(jì)、分析和優(yōu)化的演示視頻供下載。

    SimuLase™ provides: SimuLase™提供:

    the correct fundamental input that is the required starting point for any reliable device modeling. The data can be easily imported in other commercial software tools for further investigations.軟件給出了對(duì)任一可信器件建模時(shí)的準(zhǔn)確初始基本輸入。該數(shù)據(jù)也可導(dǎo)入到其他商業(yè)軟件工具中,作進(jìn)一步研究。

    an easy to use GUI-interface that allows to determine many basic characteristics of structures without any experimental feedback.軟件給出了易操作的GUI界面,可以確定很多結(jié)構(gòu)的基本特性,而不需要任何實(shí)驗(yàn)反饋。

    experimentally veryfied models that have lead to more than fifty publications in peer-reviewed journals over the last two decades.軟件給出了很多經(jīng)過實(shí)驗(yàn)驗(yàn)證的模型,在過去的二十年間,已經(jīng)有五十多篇發(fā)表的論文對(duì)這些模型進(jìn)行了研究。

    And, you don't have to be an expert in microscopic manybody physics to take full advantage of this tool. SimuLase™ can preset all parameters besides the structural design automatically - taking full advantage of the fit-parameter free nature of the microscopic models. For quick shots or research interests, SimuLase allows to influence the calculation parameters or use simplified models.而且,即使您不是微觀多體物理學(xué)方面的專家,也可以充分利用本軟件。SimuLase可以利用微觀多體模型的參數(shù)匹配,自動(dòng)的進(jìn)行結(jié)構(gòu)設(shè)計(jì)和預(yù)設(shè)置所有參數(shù)。同時(shí)為了快速瀏覽或找出研究興趣點(diǎn),軟件也允許更改計(jì)算參數(shù)或使用簡(jiǎn)化模型。

    SimuLase_Designer™ is an easy to use GUI for:本軟件所采用的GUI界面方式,可以:

    designing heterostructures by simply adding/ deleting/ changing layers of various widths and material compositions.用于設(shè)計(jì)異質(zhì)結(jié)構(gòu),只需簡(jiǎn)單的添加/刪除/改變每層的寬度和組分。

    instantly displaying the heterostructure energy levels, confinement potential, subband levels and wavefunctions.即時(shí)顯示異質(zhì)結(jié)結(jié)構(gòu)的能帶、勢(shì)能、子帶和波函數(shù)。

    calculating and displaying the background refractive index profile, transverse (confined) and longitudinal (propagating) modes and optical confinement factors.計(jì)算和顯示背景折射率剖面、橫模和縱模以及光學(xué)約束因子。

    calculating and displaying the reflection and transmission spectra of a structure,計(jì)算和顯示結(jié)構(gòu)的反射和透射譜。

     

    calculating electrical fields due to doped layers and applied voltages,計(jì)算施壓摻雜層的電場(chǎng)分布。

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